Latest News
Exhibitions & Seminars
US Air Force AWACS
Press Releases
Testimonials
-------------------
Request Brochure
Contact Us
Search Site
  E-News!
DiagnoSYS Systems Inc.
Office Contact Us
Customer User Group
Home

High Performance Test

We have DiagnoSYS offices around the world
United Kingdom France Germany India United States
DiagnoSYS Group.......
Excelling in electronic test solutions worldwide
High Performance Test
S790 ATE Tester
S500 Functional Test
DTec Series Test
PCB Diagnostics
U.D.A (Technology)
AOI - ScanPoint DT
Test Programming
PCB Test Clips
CCR Coat Removal
XJTAG Boundary Scan
For brochure download click here  
High-Performance Functional Test System

S500 Functional Test

Intelligent Software - Designed to meet the end of line production test requirements the S500 will rapidly integrate into a test department or test cell in a manufacturing environment.

Cost effective, flexible, future proofed

The S500 utilises PXI technology delivering the highest specifications expected in a functional test system but with the convenience of commercial off the shelf (COTS) instrumentation. GPIB or VXI technology can also be incorporated into the test system, so existing test equipment can be integrated.

Tailored solutions without limits
The S500 can be specified in a number of ways, catering for all levels of requirement and budget.

ATEasy, software designed for test engineers

The easy to use intelligent software is designed to meet the requirements of test engineers. Being a dedicated test platform test engineers have total control without having to make do with acquisition software that has been adapted to a test environment. Custom designed, front end graphical user interfaces can be added to meet the exact requirements of the test and customer requirements. Password protected engineer and operator options can also be set. Revision level control can also be set utilising a run time execution of the test software.

ATEasy is easy to understand and self documenting, saving engineering time and money - shortening time to test.