january

Data Capture Pod: The fastest way to generate functional test programs

23rd January, 2013

Understanding the need for a fast and efficient way to generate functional test programs, Diagnosys has designed the all new Data Capture Pod. By capturing electronic signals on an IC or at an edge connector of a PCB, the Data Capture Pod quickly converts them to a functional test program ready for use with the PinPoint range of test and fault finding systems. Having user programmable threshold voltages, sampling rates and trigger conditions, the pod handles complex circuits and has dedicated… read more