Diagnosys at Autotestcon 2010

12th August, 2010

Diagnosys will demonstrate how it has expanded the established PinPoint Test Result Server (TRS) solution to include the analysis and processing of ATML (Automatic Test Markup Language) Test Results indictments (suspect faulty group of components). This capability means that users can now benefit from a common diagnostic solution regardless of the functional test system used.

By extracting the indictment group from ATML failure data provided by a functional test system, the PinPoint will rapidly diagnose the exact cause of failure on the CCA (Circuit Card Assembly). Once the cause of the failure has been established the information is fed back into the ATML data for further use.

Diagnosys has an established Test Result Server software providing an open interface to any test system allowing the sharing of test data between any test system and this will also be demonstrated in use with the S500 and a PinPoint diagnostic system. Diagnosys today is working very closely with the ATML community to create an XML Test Result standard that allows interoperability between any IFTE/NGATS, VDATS, CASS, MCATES (TETS) ATE and the PinPoint In-Circuit tester.

Diagnosys will be at booth 213 and demonstrating ATML Test Results handling throughout the day. There will also be demonstrations of the PinPoint and S500 test systems.

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