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Functional testing of an electronic integrated circuit (IC), a circuit (PCB) or modules (LRU- Line Replaceable Module).

The functional testing of an electronic circuit involves the application of test signals to stimulate the circuit and then measure the response signals. The signals are applied and measured at the edge connector and therefore perform a functional test on the operation of the circuit, this is sometimes called a functional edge test. The pass or fail result from this type of test is also known as Go or NoGo testing because it indicates whether the UUT (Unit Under Test) is ready for use (Go) or not (NoGo).

Whether a functional test is performed on an IC, a PCB (Printed Circuit Board), or module the principle is the same and often used as the final test of an assembly or repair process to validate the UUT is fit for purpose.

Diagnosys functional test solutions provide rapid pass or fail decisions in easy-to-use and complete turnkey solutions with unique diagnostic links to identify the exact cause of a failure.

Diagnosys system(s):

Electronic in-circuit test is the process of testing individual components of a circuit (PCB) separately to make sure they function correctly or have the correct values.

In-circuit test involves applying test signals to an individual device and measuring the response, in the case of a digital component (IC) it can be functionally tested and this is known as in-circuit functional testing and distinguishes it from the process where passive impedance signatures are use.

In-circuit test can be performed using test clips so that this fixtureless test method can be quickly implemented and has the advantages that reverse netlist capture and reverse schematic capture can also be performed using the test clips. Some desk top ATE systems are called clip testers because they use this fixtureless test technique.

In-circuit bench top test systems can also be used to test components out of circuit and this makes them suitable for detecting counterfeit components. In this application the counterfeit component tester provides an IC test that can be a mixture of digital and analog signals thereby delivering a combination test on the device which can also be extended to a board level mixed signal test.

For a higher volume throughput of one type of PCB, an investment is often made in a bed-of-nails test fixture which provide physical test contact with networks on the board. Not all networks can be accessed and this will limit the in-circuit test coverage that can be achieved.

Diagnosys system(s):
PinPoint Alpha, PinPoint Sigma, PinPoint II R, Diagnostic Sub System, S790

Multi strategy test for finding the most faults and providing absolute confidence that a PCB or module is working correctly with all faults found.

To provide the best test coverage and help overcome no fault found situations, it is necessary to use a multi test strategy approach so that full physical test access can be achieved. This is especially true for testing modern technology PCBs and modules. This application of different test methods in a combinational test system means that electronic fault finding is now possible on complex PCBs with mixed signal ICs or hybrid circuits. This type of Automatic Test Equipment (ATE) is commonly used to not only test but diagnose the cause of failures and can be applied as a Radar test set, Missile tester, UAV tester and other types of applications.

Using a combination of in-circuit test, functional edge test, boundary scan and passive ASA (Analog Signature Analysis - impedance analysis) techniques means that digital, analog and mixed signal testing can be performed to maximise fault coverage on a circuit. Using these mixed signal functional testers combined with in-circuit diagnostic methods means that electronic test systems can be used in manufacturing , production testing or in a repair and maintenance electronics workshop to deliver IC fault finding capability and Go / NoGo test.

Diagnosys system(s):
PinPoint Alpha, PinPoint Sigma, PinPoint II R, Diagnostic Sub System, S790

Flexible test solutions to maximise test coverage using integrated boundary scan.

Boundary scan test, often shortened to "scan testing", is a technique defined by the IEEE 1149 standard. Relying on integrated boundary scan capability in an IC, a boundary scan tester will apply the serial data stream created by an Automatic Program Generator (APG) and then monitor the output data stream to check for correct results. If the results fail then a fault diagnosis can be automatically given for short circuit, open circuit, scan chain fault, wrong device id etc. Scan test coverage can be improved by the use of virtual clusters and intergroup test (the test of opens and shorts between scan enabled networks and non-scan enabled networks). Boundary scan techniques are also used as the basis for in-system programming (ISP), this is where a device has its functionality determined when software programming occurs while it is in a circuit.

Diagnosys system(s):
PinPoint Alpha, PinPoint Sigma, PinPoint II R, Diagnostic Sub System, S790

Performance test solutions for when failure in service isn't an option.

Performance testing is used for electronic circuit proving and electronic circuit verification. This PCB validation to design specifications is required for safety on mission critical circuits during production or following repair.

The testing is performed from the edge connector as a PCB functional test or electronic module test. Often implemented in a combinational tester, the performance testing can involve digital and analog mixed signal testing. The tests will identify gross failures and the more challenging timing related faults. When the test program is written around the design specification, then if a circuit passes the performance test it will be guaranteed to work as intended in the host equipment and this can help isolate no fault founds (NFF) somewhere in the rest of the equipment.

Diagnosys system(s):

S790, S500

Safe and rapid fault finding without knowing circuit information.

Impedance signatures are a power-off test method for a PCB which is safe, rapid and does not need to know any information about the circuit functionality. Sometimes referred to as ASA (Analog Signature Analysis) or more commonly as V/I (alternatively VI or V-I, for voltage current), the signatures are learnt from a known good circuit and then stored as part of a test program. The technique can be used manually using probes or by a flying probe tester. Performing a flying probe PCB test, or flying probe IC test, requires an automated X-Y-Z probing process where the probe movements can be programmed from CAD data or learnt from a physical board. These probe systems are sometimes referred to as a Roving Probe tester or VI tester.

Diagnosys system(s):
AutoPoint DT

The most reliable and physical test connection for an IC.

To provide physical test access to an individual integrated circuit requires an IC test clip. Commercial test clips are available for common IC packages but for a reliable, robust and repairable connection, especially with custom package types, a Diagnosys Device Test Interface (DTI) is required. With pin spacing down to 0.4 mm and designs to fit common IC packages and Russian ICs the Device Test Interface is an ideal solution.

PCBs are often coated with a protective coating (sometimes referred to as a conformal coating) and the removal of this coating is necessary to ensure good electrical contact from the test clip, DTI or test interface adaptor. These coatings protect the PCB from harsh environments and prevent the ingress of moisture or other elements. As a coating often used today, Paralene coating removal is a difficult process but one that can be performed by the Diagnosys CRS800 coating removal system.

Diagnosys system(s):
CRS8000, DTIs

Complete solutions for the test, repair and long term support of electronic systems and circuits.

Diagnosys designs and produces a range of test solutions covering a wide range of applications including; PCB trouble shooting, electronic circuit repair, legacy rehosting and PCB reverse engineering. These automated electronic test systems are classed as General Purpose Test Equipment (GPTE) as they can be used to test multiple types of circuit, they can also be known as General Purpose Electronic Test Equipment (GPETE). These systems provide automated testing for an IC, electronic circuit assembly, PCB or module. Analog test systems and PXI testers are variants of the board test systems available.

First of all you need to find your system ID and the serial number of the TestVue product. The serial number will be in the format of DIAG/12345

To find the system ID , take a look at the FAQ How do I find my TestVue System ID.

Once you have the system ID and the serial number, please  CONTACT US and we will ensure that your license is processed in the fastest possible manner!